Automated Testing of RF Modules Significantly Reduces Test Time
December 2006
50 Word
Abstract
TestStand-based automation of six different DOD classified RF
and microwave modules using interlinked RF Switch Modules &
Switch Executive, PXI2532 matrix connect all input pins to
varied test points, 4070DMM, IVI. Reports stored in MSSQL,
inserts data directly into Navy-formatted MSWord report, SPC on
key measurements. Test cycle time reduced by 88%.
